APPEARANCE INSPECTING DEVICE

PURPOSE:To reduce the man-hour of a soldering appearance inspection by automatically setting an inspection parameter. CONSTITUTION:A preliminarily known defective part in a package 1 is irradiated with an irradiation light (a) from an illumination 4, and the picture data are fetched by a camera 5. A...

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1. Verfasser: KOBORI YOICHIRO
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To reduce the man-hour of a soldering appearance inspection by automatically setting an inspection parameter. CONSTITUTION:A preliminarily known defective part in a package 1 is irradiated with an irradiation light (a) from an illumination 4, and the picture data are fetched by a camera 5. A picture processor 6 operates the picture processing of the picture data from the camera 5 in each of plural binary levels. The picture processor 6 detects the gradation value of each defective part in order to set a judgement value based on the picture data, and inspects the picture data of a normal part by using the binary levels and the judgement value. The picture processor 6 totals the number of the detection of the defective part from the inspected result, calculates the number of an excessive recognition, and sets the binary level and the judgement value in which the number of the excessive recognition can be the minimum as the inspection parameter.