METHOD FOR FLUORESCENT X-RAY ANALYSIS

PURPOSE:To eliminate an error in measurement due to nonuniformity of the thickness of a cell window and to improve precision by correcting the intensity of a detected fluorescent X ray by using the relationship between the thickness of a resin sheet and the fluorescent X ray which is determined beforehand. CONSTITUTION:In a state of a sample 7 being held in a sample cell 4, a primary X ray from an X-ray tube 9 is applied thereto through a cell window 6. Thereby a fluorescent X ray 10 is generated from the sample 7 and it is detected by an X-ray detecting part 11. By processing a detection output thereof in an arithmetic display part 12, the quantity of sulfur contained in the sample 7, for instance, is measured. A thickness measuring device 16 measures the thickness of a resin sheet used as the cell window 6. Generally, the dimensions and the shape of the cell window 6 are definite and the size of the resin sheet is also definite. A balance being used as the device 16, therefore, the thickness is determined from a measured weight and the data thereon are inputted to an arithmetic unit 14. By using the relation-ship between the thickness and the fluorescent X ray which is determined beforehand, the intensity of the detected X ray is corrected.