TEST METHOD FOR SEMICONDUCTOR MEMORY

PURPOSE:To reduce input data from the external and to shorten the test time. CONSTITUTION:This method which uses scan cells 2 to test semiconductor memories 11 to 1n is characterized by using at least two data inputs out of plural data of semiconductor memories as common data inputs and performing t...

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1. Verfasser:	ISHIKAWA MITSUAKI
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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creator	ISHIKAWA MITSUAKI
description	PURPOSE:To reduce input data from the external and to shorten the test time. CONSTITUTION:This method which uses scan cells 2 to test semiconductor memories 11 to 1n is characterized by using at least two data inputs out of plural data of semiconductor memories as common data inputs and performing the test so that these common data inputs are implemented by receiving data from the same scan cell for data input.
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subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
title	TEST METHOD FOR SEMICONDUCTOR MEMORY
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