TEST METHOD FOR SEMICONDUCTOR MEMORY

TEST METHOD FOR SEMICONDUCTOR MEMORY

PURPOSE:To reduce input data from the external and to shorten the test time. CONSTITUTION:This method which uses scan cells 2 to test semiconductor memories 11 to 1n is characterized by using at least two data inputs out of plural data of semiconductor memories as common data inputs and performing t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: ISHIKAWA MITSUAKI
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PURPOSE:To reduce input data from the external and to shorten the test time. CONSTITUTION:This method which uses scan cells 2 to test semiconductor memories 11 to 1n is characterized by using at least two data inputs out of plural data of semiconductor memories as common data inputs and performing the test so that these common data inputs are implemented by receiving data from the same scan cell for data input.