FORMATION OF ALUMINUM FILM

PURPOSE:To form an Al film having superior crystallinity and low specific resistivity by impressing a negative bias voltage in specific range on a base material at the time of sputtering an Al target by means of an inert gas ion beam in vacuum. CONSTITUTION:In vacuum, an inert gas ion beam 4 is extr...

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Bibliographische Detailangaben
Hauptverfasser: INOUE DAISUKE, MAEKAWA HARUO, NOGAWA SHUICHI
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To form an Al film having superior crystallinity and low specific resistivity by impressing a negative bias voltage in specific range on a base material at the time of sputtering an Al target by means of an inert gas ion beam in vacuum. CONSTITUTION:In vacuum, an inert gas ion beam 4 is extracted from an ion source 2 and an Al target is irradiated with this ion beam 4, by which Al grains 6a from the target 6 are deposited onto the surface of a base material 10 to form an Al film. At this time, a negative bias voltage in the range between -50 and -350V is impressed from a D.C. electric power source 14 via a holder 12 on the base material 10. By this method, a high-efficiency Al film having superior crystallinity and reduced in specific resistivity can be formed on the surface of the base material 10.