SOCKET FOR SEMICONDUCTOR DEVICE USE

PURPOSE:To easily check whether the contact between a lead on a semiconductor device and a lead pin on a socket is defective or not by installing a lead pins, for continuity inspection use, one end of each of which is exposed on a socket retainer and the other end of which can be brought into contac...

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Bibliographische Detailangaben
1. Verfasser: HIKASA KAZUHIKO
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PURPOSE:To easily check whether the contact between a lead on a semiconductor device and a lead pin on a socket is defective or not by installing a lead pins, for continuity inspection use, one end of each of which is exposed on a socket retainer and the other end of which can be brought into contact with the lead on the semiconductor device. CONSTITUTION:A socket for semiconductor device use is provided with the following: a plurality of socket lead pins 2 which can be brought into contact with each rear surface of leads 10a on a flat package-type semiconductor device 10 to be mounted; a pin pressure part 5 which presses the leads 10a to the individual socket lead pins 2 and which is composed of an insulating material; and a socket retainer 6 which is attached to the pin pressure part 5 and which can be opened and closed with reference to the mounting face of the socket lead pins 2. Lead pins 9, for continuity inspection use, one end of each of which is exposed to the surface of the socket retainer 6 and the other end of which is exposed to the lower end of the pin pressure part 5 are provided inside the pin pressure part 5.