MEASURING DEVICE FOR CHARGED PARTICLE POSITION AND VACUUM DUCT

PURPOSE:To get information of passing positions of charged particles over a long distance along a vacuum duct. CONSTITUTION:A plurality of strip lines 2 along the axial direction of a vacuum duct 1 are installed on the inner wall surface of a vacuum duct so that it is possible to get information of...

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Bibliographische Detailangaben
1. Verfasser:	CHIKUSHIMA CHIHIRO
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS PLASMA TECHNIQUE PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To get information of passing positions of charged particles over a long distance along a vacuum duct. CONSTITUTION:A plurality of strip lines 2 along the axial direction of a vacuum duct 1 are installed on the inner wall surface of a vacuum duct so that it is possible to get information of the positions of charged particles in the axial direction and the radial direction sccording to the hourly variations of the output signals of the above plurality of strip lines 2.