IC TESTING BOARD

IC TESTING BOARD

PURPOSE:To transmit a normal test signal to an IC to be measured. CONSTITUTION:Buffer ICs 1 are provided between the branch points between a main signal line 4a and branch signal lines 4b not only to shorten the rising and falling times of the test signals on the respective branch signal lines but a...

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1. Verfasser: SAKAI IWAO
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator SAKAI IWAO
description PURPOSE:To transmit a normal test signal to an IC to be measured. CONSTITUTION:Buffer ICs 1 are provided between the branch points between a main signal line 4a and branch signal lines 4b not only to shorten the rising and falling times of the test signals on the respective branch signal lines but also to successively delay the test signals on the respective branch signal lines. The driving force of the test signals is enhanced and the cross talk noise between the branch signal lines is reduced. As a result, a normal test signal can be applied to the IC to be measured and testing accuracy is enhanced.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH04319676A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH04319676A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH04319676A3</originalsourceid><addsrcrecordid>eNrjZBDwdFYIcQ0O8fRzV3Dydwxy4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHgYmxoaWZuZmjsbEqAEA9pwdkw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>IC TESTING BOARD</title><source>esp@cenet</source><creator>SAKAI IWAO</creator><creatorcontrib>SAKAI IWAO</creatorcontrib><description>PURPOSE:To transmit a normal test signal to an IC to be measured. CONSTITUTION:Buffer ICs 1 are provided between the branch points between a main signal line 4a and branch signal lines 4b not only to shorten the rising and falling times of the test signals on the respective branch signal lines but also to successively delay the test signals on the respective branch signal lines. The driving force of the test signals is enhanced and the cross talk noise between the branch signal lines is reduced. As a result, a normal test signal can be applied to the IC to be measured and testing accuracy is enhanced.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1992</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19921110&amp;DB=EPODOC&amp;CC=JP&amp;NR=H04319676A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19921110&amp;DB=EPODOC&amp;CC=JP&amp;NR=H04319676A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SAKAI IWAO</creatorcontrib><title>IC TESTING BOARD</title><description>PURPOSE:To transmit a normal test signal to an IC to be measured. CONSTITUTION:Buffer ICs 1 are provided between the branch points between a main signal line 4a and branch signal lines 4b not only to shorten the rising and falling times of the test signals on the respective branch signal lines but also to successively delay the test signals on the respective branch signal lines. The driving force of the test signals is enhanced and the cross talk noise between the branch signal lines is reduced. As a result, a normal test signal can be applied to the IC to be measured and testing accuracy is enhanced.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1992</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBDwdFYIcQ0O8fRzV3Dydwxy4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHgYmxoaWZuZmjsbEqAEA9pwdkw</recordid><startdate>19921110</startdate><enddate>19921110</enddate><creator>SAKAI IWAO</creator><scope>EVB</scope></search><sort><creationdate>19921110</creationdate><title>IC TESTING BOARD</title><author>SAKAI IWAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH04319676A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1992</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SAKAI IWAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SAKAI IWAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IC TESTING BOARD</title><date>1992-11-10</date><risdate>1992</risdate><abstract>PURPOSE:To transmit a normal test signal to an IC to be measured. CONSTITUTION:Buffer ICs 1 are provided between the branch points between a main signal line 4a and branch signal lines 4b not only to shorten the rising and falling times of the test signals on the respective branch signal lines but also to successively delay the test signals on the respective branch signal lines. The driving force of the test signals is enhanced and the cross talk noise between the branch signal lines is reduced. As a result, a normal test signal can be applied to the IC to be measured and testing accuracy is enhanced.</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title IC TESTING BOARD
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T09%3A42%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SAKAI%20IWAO&rft.date=1992-11-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH04319676A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true