IC TESTING BOARD
PURPOSE:To transmit a normal test signal to an IC to be measured. CONSTITUTION:Buffer ICs 1 are provided between the branch points between a main signal line 4a and branch signal lines 4b not only to shorten the rising and falling times of the test signals on the respective branch signal lines but a...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PURPOSE:To transmit a normal test signal to an IC to be measured. CONSTITUTION:Buffer ICs 1 are provided between the branch points between a main signal line 4a and branch signal lines 4b not only to shorten the rising and falling times of the test signals on the respective branch signal lines but also to successively delay the test signals on the respective branch signal lines. The driving force of the test signals is enhanced and the cross talk noise between the branch signal lines is reduced. As a result, a normal test signal can be applied to the IC to be measured and testing accuracy is enhanced. |
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