IC TESTING BOARD

PURPOSE:To transmit a normal test signal to an IC to be measured. CONSTITUTION:Buffer ICs 1 are provided between the branch points between a main signal line 4a and branch signal lines 4b not only to shorten the rising and falling times of the test signals on the respective branch signal lines but a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: SAKAI IWAO
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PURPOSE:To transmit a normal test signal to an IC to be measured. CONSTITUTION:Buffer ICs 1 are provided between the branch points between a main signal line 4a and branch signal lines 4b not only to shorten the rising and falling times of the test signals on the respective branch signal lines but also to successively delay the test signals on the respective branch signal lines. The driving force of the test signals is enhanced and the cross talk noise between the branch signal lines is reduced. As a result, a normal test signal can be applied to the IC to be measured and testing accuracy is enhanced.