METHOD FOR CREATING INTERGRANULAR FRECTURE

PURPOSE:To efficiently create an intergranular frecture in a sensitized material sample of an austenic Fe-Ni-Cr alloy to be used for Auger electronic spectroscopy, etc. CONSTITUTION:A low-speed tensile test piece made of the sample is used as a cathode, electrolyzed in 1N sulfuric acid contg. sodium...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	MORISAWA JUNICHIRO
Format:	Patent
Sprache:	eng
Schlagworte:	ALLOYS CHEMICAL SURFACE TREATMENT CHEMISTRY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DIFFUSION TREATMENT OF METALLIC MATERIAL FERROUS OR NON-FERROUS ALLOYS GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUSMETALS OR ALLOYS INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL MAKING METAL MALLEABLE BY DECARBURISATION, TEMPERING OR OTHERTREATMENTS METALLURGY METALLURGY OF IRON MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLICMATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASSC23 AND AT LEAST ONEPROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25 NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE TREATMENT OF ALLOYS OR NON-FERROUS METALS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	PURPOSE:To efficiently create an intergranular frecture in a sensitized material sample of an austenic Fe-Ni-Cr alloy to be used for Auger electronic spectroscopy, etc. CONSTITUTION:A low-speed tensile test piece made of the sample is used as a cathode, electrolyzed in 1N sulfuric acid contg. sodium arsenite and charged with hydrogen. The test piece is heated to discharge hydrogen, the process is repeated to accelerate intergranular embrittlement and then to break the teat piece, and an intergranular frecture is created. The intergranular frecture for the analysis is efficiently created by this method.