FORMATION OF FINE PATTERN

PURPOSE:To increase the number of print-resisting times by a method wherein an inorganic resist film is etched through an organic resist pattern to form a masking layer made of inorganic resist on a substrate and a plated layer is formed on a part of the substrate where the masking layer is not form...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KUBOZONO KENICHI, OKAZAKI AKIRA
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PURPOSE:To increase the number of print-resisting times by a method wherein an inorganic resist film is etched through an organic resist pattern to form a masking layer made of inorganic resist on a substrate and a plated layer is formed on a part of the substrate where the masking layer is not formed and then the plated layer is transferred to the material to be processed. CONSTITUTION:An organic resist layer 3 is formed on an inorganic resist layer 2 which is formed on a conductive board 1. Then, a photo mask 4 having the specified black patterns 4a is laid on top of the organic resist layer 3 and ultraviolet rays is cast on the organic resist layer 3. After that, the substrate is developed to remove the organic resist layer 3 of the areas on which, ultraviolet rays was not cast for forming an organic resist pattern 3' having recessed parts 3a. Nextly, the inorganic resist layer 2 is etched through the recessed parts 3a of the pattern 3' and then the pattern 3' is removed to form a masking layer 2' which is made of organic resist that has recessed parts 2a. By this method, a fine pattern can be fabricated very accurately and efficiently.