TROUBLE INFORMATION COLLECTING SYSTEM FOR ELECTRONIC COMPUTER SYSTEM
PURPOSE:To collect information required for investigating the cause of abnormality when the instruction abnormality is detected at an electronic computer system equipped with a virtual memory function. CONSTITUTION:Instruction analysis is executed by an executing instruction analyzing means 50. By t...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PURPOSE:To collect information required for investigating the cause of abnormality when the instruction abnormality is detected at an electronic computer system equipped with a virtual memory function. CONSTITUTION:Instruction analysis is executed by an executing instruction analyzing means 50. By this analysis, the information required for investigating the cause of abnormality is specified. The analysis of an executing instruction is executed from the execution start point of a segment calculated by an entrance point extracting means 30. By this operation, the instruction to be analyzed is limited. On the other hand, by collecting memory images not existing on a main memory but existing only at a virtual memory space, the collection of the information is prevented from being missed, and the entire quantity of collected information is reduced. Therefore, the increase of a fault information storage area to be enlarged with the increase of the main memory is reduced, and a secondary storage device can be effectively utilized. |
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