PATTERN POSITION DETECTION DEVICE

PATTERN POSITION DETECTION DEVICE

PURPOSE:To enable detection operation to be made easily and pattern position detection to be performed positively. CONSTITUTION:An image pick-up device 3 which allows a portion of a pattern 2 in symmetrical shape formed at a product to be detected 1 to be in a two-dimensional image, a symmetrical pr...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: TSUBOI YUZO
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:PURPOSE:To enable detection operation to be made easily and pattern position detection to be performed positively. CONSTITUTION:An image pick-up device 3 which allows a portion of a pattern 2 in symmetrical shape formed at a product to be detected 1 to be in a two-dimensional image, a symmetrical property operation means 6 which calculates the degree of symmetry of a pattern image of the pattern 2 at each position of the image. and a symmetrical position detection means 7 for detecting most symmetrical position according to a distribution of the degree of symmetry which is obtained by the symmetry operation means 6 are provided.