DETECTING METHOD FOR PRESENCE OF SHRINK FILM

PURPOSE:To provide the method for detecting the presence of a shrink film covered on a material without providing a new light source and without any dependence on the transparency or opacity of the shrink film. CONSTITUTION:A first sensor (5) and a second sensor (6) are provided at the outlet of a s...

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Hauptverfasser:	TAKI KENSUKE, KOIKE SHUNJI
Format:	Patent
Sprache:	eng
Schlagworte:	DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To provide the method for detecting the presence of a shrink film covered on a material without providing a new light source and without any dependence on the transparency or opacity of the shrink film. CONSTITUTION:A first sensor (5) and a second sensor (6) are provided at the outlet of a shrinker (4b), and the method has the constitution for discriminating the presence of a shrink film by measuring to compare and calculate the shrink film and the radiation energy of a material respectively. Since the shrink film and the radiation energy of the material depend on respective heat capacities, discrimination can be made possible by comparing to calculate their values.