X-RAY SPECTRUM ANALYZER

PURPOSE:To set measurement conditions applicable for an analyzed sample by adding the ZAF quantitative simulated calculation capability to a computer performing the ZAF quantitative calculation. CONSTITUTION:An electron beam 7 emitted from an electron gun 3 is focused by a focusing lens 9, then it i...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	DOI SEIZO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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