PLASMA VAPOR PHASE GROWTH DEVICE

PURPOSE:To provide the plasma vapor growth device which grows thin films of a uniform thickness on a substrate to be treated by coating the peripheral part of an upper electrode having gas supply openings facing a lower electrode imposed with the substrate with insulating films patterned and formed...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: NAKAHIRA JUNYA
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator NAKAHIRA JUNYA
description PURPOSE:To provide the plasma vapor growth device which grows thin films of a uniform thickness on a substrate to be treated by coating the peripheral part of an upper electrode having gas supply openings facing a lower electrode imposed with the substrate with insulating films patterned and formed to concentrical or radial shapes. CONSTITUTION:Plasma CVD having the upper electrode 2 and lower electrode 3 of a parallel flat plate shape shown in the figure is used and silane and NH3 are used as reaction gases 5. The above mentioned gaseous mixture is supplied 8 by gaseous N2 as a carrier gas into a reaction chamber 1. While the vacuum degree in the chamber 1 is maintained under 1Torr by operating a discharge system, a high frequency power source 7 of 13.56MHz is operated. Plasma is generated between the upper electrode 2 and the lower electrode 3 in this way to effect plasma CVD and to form an Si3N4 film of about 1mum thickness on the substrate 6 to be treated. The peripheral part of the electrode 2 and the inner side thereof are coated with the plural concentrical insulating films 10 or radial insulating films 11 so that the film is formed with the good film thickness distribution even if the diameter of the wafer 6 is large.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH0372080A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH0372080A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH0372080A3</originalsourceid><addsrcrecordid>eNrjZFAI8HEM9nVUCHMM8A9SCPBwDHZVcA_yDw_xUHBxDfN0duVhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfFeAR4GxuZGBhYGjsZEKAEAr-whkQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PLASMA VAPOR PHASE GROWTH DEVICE</title><source>esp@cenet</source><creator>NAKAHIRA JUNYA</creator><creatorcontrib>NAKAHIRA JUNYA</creatorcontrib><description>PURPOSE:To provide the plasma vapor growth device which grows thin films of a uniform thickness on a substrate to be treated by coating the peripheral part of an upper electrode having gas supply openings facing a lower electrode imposed with the substrate with insulating films patterned and formed to concentrical or radial shapes. CONSTITUTION:Plasma CVD having the upper electrode 2 and lower electrode 3 of a parallel flat plate shape shown in the figure is used and silane and NH3 are used as reaction gases 5. The above mentioned gaseous mixture is supplied 8 by gaseous N2 as a carrier gas into a reaction chamber 1. While the vacuum degree in the chamber 1 is maintained under 1Torr by operating a discharge system, a high frequency power source 7 of 13.56MHz is operated. Plasma is generated between the upper electrode 2 and the lower electrode 3 in this way to effect plasma CVD and to form an Si3N4 film of about 1mum thickness on the substrate 6 to be treated. The peripheral part of the electrode 2 and the inner side thereof are coated with the plural concentrical insulating films 10 or radial insulating films 11 so that the film is formed with the good film thickness distribution even if the diameter of the wafer 6 is large.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SEMICONDUCTOR DEVICES ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>1991</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19910327&amp;DB=EPODOC&amp;CC=JP&amp;NR=H0372080A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19910327&amp;DB=EPODOC&amp;CC=JP&amp;NR=H0372080A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAKAHIRA JUNYA</creatorcontrib><title>PLASMA VAPOR PHASE GROWTH DEVICE</title><description>PURPOSE:To provide the plasma vapor growth device which grows thin films of a uniform thickness on a substrate to be treated by coating the peripheral part of an upper electrode having gas supply openings facing a lower electrode imposed with the substrate with insulating films patterned and formed to concentrical or radial shapes. CONSTITUTION:Plasma CVD having the upper electrode 2 and lower electrode 3 of a parallel flat plate shape shown in the figure is used and silane and NH3 are used as reaction gases 5. The above mentioned gaseous mixture is supplied 8 by gaseous N2 as a carrier gas into a reaction chamber 1. While the vacuum degree in the chamber 1 is maintained under 1Torr by operating a discharge system, a high frequency power source 7 of 13.56MHz is operated. Plasma is generated between the upper electrode 2 and the lower electrode 3 in this way to effect plasma CVD and to form an Si3N4 film of about 1mum thickness on the substrate 6 to be treated. The peripheral part of the electrode 2 and the inner side thereof are coated with the plural concentrical insulating films 10 or radial insulating films 11 so that the film is formed with the good film thickness distribution even if the diameter of the wafer 6 is large.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1991</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAI8HEM9nVUCHMM8A9SCPBwDHZVcA_yDw_xUHBxDfN0duVhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfFeAR4GxuZGBhYGjsZEKAEAr-whkQ</recordid><startdate>19910327</startdate><enddate>19910327</enddate><creator>NAKAHIRA JUNYA</creator><scope>EVB</scope></search><sort><creationdate>19910327</creationdate><title>PLASMA VAPOR PHASE GROWTH DEVICE</title><author>NAKAHIRA JUNYA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH0372080A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1991</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>NAKAHIRA JUNYA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAKAHIRA JUNYA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PLASMA VAPOR PHASE GROWTH DEVICE</title><date>1991-03-27</date><risdate>1991</risdate><abstract>PURPOSE:To provide the plasma vapor growth device which grows thin films of a uniform thickness on a substrate to be treated by coating the peripheral part of an upper electrode having gas supply openings facing a lower electrode imposed with the substrate with insulating films patterned and formed to concentrical or radial shapes. CONSTITUTION:Plasma CVD having the upper electrode 2 and lower electrode 3 of a parallel flat plate shape shown in the figure is used and silane and NH3 are used as reaction gases 5. The above mentioned gaseous mixture is supplied 8 by gaseous N2 as a carrier gas into a reaction chamber 1. While the vacuum degree in the chamber 1 is maintained under 1Torr by operating a discharge system, a high frequency power source 7 of 13.56MHz is operated. Plasma is generated between the upper electrode 2 and the lower electrode 3 in this way to effect plasma CVD and to form an Si3N4 film of about 1mum thickness on the substrate 6 to be treated. The peripheral part of the electrode 2 and the inner side thereof are coated with the plural concentrical insulating films 10 or radial insulating films 11 so that the film is formed with the good film thickness distribution even if the diameter of the wafer 6 is large.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JPH0372080A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SEMICONDUCTOR DEVICES
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title PLASMA VAPOR PHASE GROWTH DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T11%3A47%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NAKAHIRA%20JUNYA&rft.date=1991-03-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPH0372080A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true