TESTING METHOD FOR MICROCOMPUTER LSI

PURPOSE:To decide which part a defect is present at by comparing a test result with an expected value and supplying a 2nd actuation signal to a CPU and outputting data for analysis from a storage device unless the test result matches the expected value. CONSTITUTION:In test operation, the data for analysis including the test result and a halfway value of the test are stored in storage areas 14a and 14b of a storage device 14 and a 1st actuation signal 26 is supplied to a CPU 12 to output the test result from the storage device 14, so that the test result is compared with the expected value. When the test result does not match the expected value, the 2nd actuation signal 28 is supplied to the CPU 12 to output the data for analysis from the storage device 14. Consequently, the test is stably conducted at low cost and when it is decided that there is a defect, which part the defect is present at is decided.