APPARATUS FOR INSPECTING AND SORTING ELECTRIC CHARACTERISTICS OF CHIP PART
PURPOSE:To enhance the processing capacity of an inspection and sorting apparatus by charging a large amount of works in a chip feeder part and subsequently arranging the works automatically to feed the same. CONSTITUTION:The works 2 charged in a chip feeder 1 are arranged in a row along the passage...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PURPOSE:To enhance the processing capacity of an inspection and sorting apparatus by charging a large amount of works in a chip feeder part and subsequently arranging the works automatically to feed the same. CONSTITUTION:The works 2 charged in a chip feeder 1 are arranged in a row along the passage of the side wall of the chip feeder 1 to be fed to a chuter 3. The works 2 slides on the chuter 3 to reach a work feed path 4 and slides down to be stopped in the work feed path 4 by an a-stopper 7. Next, a separation shutter 9 presses the work just this side among the inspection standby works so as to leave one inspection standby work and, in order to carry the inspection standby work to the position of a measuring terminal 10 by opening the a-stopper 7, the inspection standby work is received by a b-stopper 8. When the inspection standby work is received, the measuring terminal 10 comes into contact with the work 2 to measure the electric characteristics of the work. Subsequently, a discrimination arm 17 is shaken by the rotary solenoid 16 provided to a sorting part and superior and inferior products are discriminated on the basis of the superior and inferior product signals emitted from the measuring terminal 10 to be received in receivers 18. |
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