FLUORESCENT X-RAY ANALYZER

PURPOSE:To improve the accuracy of measurement without requiring filter working of high accuracy by providing two X-ray detectors disposed with two kinds of filters which vary in the wavelength of min. transmissivity on the front surfaces. CONSTITUTION:The apparatus consists of the two X-ray detecto...

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1. Verfasser: NAKATANI TAKEHIKO
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To improve the accuracy of measurement without requiring filter working of high accuracy by providing two X-ray detectors disposed with two kinds of filters which vary in the wavelength of min. transmissivity on the front surfaces. CONSTITUTION:The apparatus consists of the two X-ray detectors 3, 4 disposed with two kinds of the filters F 1, F 2 which vary in the wavelength of the min. transmissivity on the front surfaces, a means 2 for adjusting the inclination of the one filter F 2, and an arithmetic section 5 which computes the difference between the detected outputs thereof. The intensities I1, I2 of the X-rays transmitted through the filters F 1, F 2 are measured by the detectors 3, 4 and I1-I2 is determined in the arithmetic section 5. The angle of inclination of the filter F 2 is adjusted by an inclination adjusting means 2 so as to attain I1-I2=0. The X-rays exclusive of a measuring wavelength lambda0 is mostly removed by the inclination adjustment of this filter F 2.