DEVICE AND METHOD OF INSPECTING STORAGE DEVICE AND EXCLUSIVE OR GATE

PURPOSE: To inspect a latch by itself by including a step for storing an input logic value at a storage and a step for comparing the stored logic value with a reference value that is derived from the input logic value. CONSTITUTION: The storage that is used by a DCVS logic circuit can be set to be i...

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Bibliographische Detailangaben
1. Verfasser:	ROBAATO KEBIN MONTOOI
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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Beschreibung
Zusammenfassung:	PURPOSE: To inspect a latch by itself by including a step for storing an input logic value at a storage and a step for comparing the stored logic value with a reference value that is derived from the input logic value. CONSTITUTION: The storage that is used by a DCVS logic circuit can be set to be in a specific state when starting a test cycle. Then, a test value can be stored in a logic circuit so that the combination logic in the circuit can be tested completely. In a LETCH device with an organizational structure shown in figure, a proper operation can be confirmed by comparing signals on PREMEM L1 and Q.