TEST FUNCTION CONTROL SYSTEM FOR EXCHANGE

PURPOSE:To efficiently execute the test by supplying command data from an arbitrary data terminal stored in a data terminal storage circuit to test a desired terminal or terminal storage circuit from an arbitrary place. CONSTITUTION:A central controller 20 has a test function in dicating means 210 and controls a main switch 10 to control a terminal storage circuit 30 and a data terminal storage circuit 40 through an internal control bus 70. The terminal storage circuit 30 has a test function control means 310 and stores a terminal 50, and the data terminal storage circuit 40 has a command data transmitting and receiving means 410 and stores a data terminal 60. Command data is supplied from the arbitrary data terminal 60 stored in the data terminal storage circuit 40 to test the desired terminal 50 or terminal storage circuit 30 from an arbitrary place. Thus, the data terminal nearest to the terminal to be tested is used to efficiently execute the test.