DETECTION OF ABNORMALITY IN PROCESSING

PURPOSE:To facilitate inputting and changing of fresh knowledge by executing the pattern match processing to investigate the similarity between source data and reference data by every factor and deciding the factor for the abnormality from the resulted data. CONSTITUTION:The densities of a control s...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HATANAKA ISAMU, NAKAMURA TAKASHI, IWAGAMI NOBUYUKI, SAOTOME ATSUSHI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PURPOSE:To facilitate inputting and changing of fresh knowledge by executing the pattern match processing to investigate the similarity between source data and reference data by every factor and deciding the factor for the abnormality from the resulted data. CONSTITUTION:The densities of a control strip photograph formed at the time of abnormality are measured in the photographic processing. The reference data is formed from the resulted density values and this data is prepd. for each of the factors for various kinds of abnormality. The control strip photograph is formed and the source data determined therefrom and the knowledge data are compared at the time of investigating the working state of the process. If a remedy is needed as a result thereof, the pattern match processing to investigate the similarity of the source data and the respective sets of the reference data by respectively changing the respective sets of the reference data with respect to the source data for each of the respective factors and >=1 pieces of the factors are selected for the resulted matching data.