X-RAY DIFFRACTION APPARATUS

PURPOSE:To record and observe crystal informations on a sample wherein the state of crystals is changing every moment, by a method wherein X-rays irradiate the sample and an X-ray diffraction image from the sample is accumulated in a part of an image accumulation plate through an opening of a shield...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: IWAI SATORU, KATAYAMA CHUJI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PURPOSE:To record and observe crystal informations on a sample wherein the state of crystals is changing every moment, by a method wherein X-rays irradiate the sample and an X-ray diffraction image from the sample is accumulated in a part of an image accumulation plate through an opening of a shielding plate. CONSTITUTION:The X-rays from an X-ray source 12 irradiate a sample 17 through a collimator 11. By the irradiation of the X-rays, diffracted X-rays (x) (indicated by an arrow) are emitted from the sample 17, and it reaches a fluorescent substance layer of an image accumulation plate 1 through an opening 15 and accumulated therein as an X-ray diffraction image. Next, the image accumulation plate 1 is rotated at a prescribed angle as indicated by an arrow (r) by a pulse motor 2, and X-ray diffraction images of the sample 17 are accumulated one after another. Next, a reading device 16 is moved as indicated by an arrow (c) and thereby accumulated data are read.