ELECTRON BEAM DIRECT LITHOGRAPHY EQUIPMENT

PURPOSE:To facilitate proper exposure and realize high quality printed board exposure by a method wherein auxiliary deflection scanning is superposed upon main deflection scanning and, even if the width of a pattern to be lithographed is variously changed, the main deflection scanning speed is contr...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: TOBUSE HIROAKI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!