JP2972665B

PROBLEM TO BE SOLVED: To enable the inspection result of an electronic device to be analytically processed with high efficiency, by a method wherein inspection data outputted from an inspection device are discontinuously transmitted to a processing device. SOLUTION: Works such as electronic devices...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NAKAZATO JUN, TANIGUCHI JUZO, SHIMOSHA SADAO, SAKATA MASAO, HASHIMOTO TAIZO, OOYAMA JUICHI, MATSUOKA KAZUHIKO, ISHIKAWA SEIJI, NAGATOMO HIROTO, SATO OSAMU, MURAMATSU KIMIO, EBARA, OKABE TSUTOMU, SAKAMOTO JUZABURO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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