JP2753545B

Bibliographische Detailangaben

Hauptverfasser:	NAKAMURA KEN, ISHII MIKIHIKO, MYOSHI KATSUYA, ICHIHARA YUTAKA, YAMAGUCHI MASAYA, ASAMI TAKESHI, ICHIKAWA HAJIME, MIZOROIKE SHIGEO
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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