JP2560675B

In order to enable measurement of insulation resistance values of a number of electronic parts such as chip capacitors with high accuracy and without the reducing measurement efficiency of characteristics, such as the capacitance, capacitance values of chip capacitors which are held by respective ho...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TAKAHASHI AKIHIKO, KAWABATA SHOICHI, SAKAI NORIO, HAMURO MITSUO, KURABE MIKI, MINOWA KENJI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!