JP2560675B

In order to enable measurement of insulation resistance values of a number of electronic parts such as chip capacitors with high accuracy and without the reducing measurement efficiency of characteristics, such as the capacitance, capacitance values of chip capacitors which are held by respective holding portions of a turntable are first measured in a capacitance measuring position during intermittent feeding of the turntable. When an insulation resistance measuring region is filled with those of the chip capacitors whose capacitance values have been measured the turntable is stopped. In this stopped state, a plurality of chip capacitors being located in the insulation resistance measuring region are simultaneously charged and subjected to the measurement of insulation resistance values.