JP2533178B

PURPOSE:To achieve work of connecting and separating a tester head manually with ease and accurately by controlling the tester head loaded with a spring with a lifting and rotating mechanism provided on a stand. CONSTITUTION:A sample carried on a sample base provided on a stand 1 is tested through a...

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Hauptverfasser:	KUBOYAMA MAKOTO, SHINOOKA TOSHINORI, WAKATSUKI YASUHIRO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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creator	KUBOYAMA MAKOTO SHINOOKA TOSHINORI WAKATSUKI YASUHIRO
description	PURPOSE:To achieve work of connecting and separating a tester head manually with ease and accurately by controlling the tester head loaded with a spring with a lifting and rotating mechanism provided on a stand. CONSTITUTION:A sample carried on a sample base provided on a stand 1 is tested through a tester head 2 placed on the top of an electron beam tester. This head 2 is loaded with a spring provided between a side frame 10 and the head 2 and the vertical movement and holding thereof are controlled with a vertical guide table 3 and a vertically holding mechanism 4 between the stand 1 and the frame. Like, the rotation and holding of the head are controlled with a rotation mechanism 5 and a rotation holding mechanism 6. With such an arrangement, the tester head weighting 100-200kg can be separated manually from the stand with ease and accurately to connect an exchange tester head to the stand.
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With such an arrangement, the tester head weighting 100-200kg can be separated manually from the stand with ease and accurately to connect an exchange tester head to the stand.</description><edition>6</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>1996</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19960911&DB=EPODOC&CC=JP&NR=2533178B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19960911&DB=EPODOC&CC=JP&NR=2533178B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KUBOYAMA MAKOTO</creatorcontrib><creatorcontrib>SHINOOKA TOSHINORI</creatorcontrib><creatorcontrib>WAKATSUKI YASUHIRO</creatorcontrib><title>JP2533178B</title><description>PURPOSE:To achieve work of connecting and separating a tester head manually with ease and accurately by controlling the tester head loaded with a spring with a lifting and rotating mechanism provided on a stand. 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CONSTITUTION:A sample carried on a sample base provided on a stand 1 is tested through a tester head 2 placed on the top of an electron beam tester. This head 2 is loaded with a spring provided between a side frame 10 and the head 2 and the vertical movement and holding thereof are controlled with a vertical guide table 3 and a vertically holding mechanism 4 between the stand 1 and the frame. Like, the rotation and holding of the head are controlled with a rotation mechanism 5 and a rotation holding mechanism 6. With such an arrangement, the tester head weighting 100-200kg can be separated manually from the stand with ease and accurately to connect an exchange tester head to the stand.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
title	JP2533178B
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