JP2521607B

PURPOSE:To measure an adherence value of a paint film accurately by a Compton scattering beam without stopping a painting line by determining a calibration curve with high reliability using a reference sample for a sample to be measured which has the wet painted film on a ground substrate continuing...

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Bibliographische Detailangaben
Hauptverfasser: TANAKA AKIRA, TANAKA MITSURU, MATSURA NAOKI, FUKUDA SHIGEO, SHIBATA SEIYA, NISHAMA HIROKI, FUKUZAKI TATSUO
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PURPOSE:To measure an adherence value of a paint film accurately by a Compton scattering beam without stopping a painting line by determining a calibration curve with high reliability using a reference sample for a sample to be measured which has the wet painted film on a ground substrate continuing in the direction of flowing. CONSTITUTION:In a process of determining a calibration curve, first, the weight of a ground substrate 2 is measured before the coating of a reference sample 2Pw. After the measurement, the weight of the reference sample 2Pw wet after the coating is measured while the intensity of a Compton scattering beam BC is measured. After the measurement, a deposit quantity of the paint film Pw of the reference sample 2Pw wet is determined from both the weights to obtain a calibration curve based on the deposit quantity and the intensity of the Compton scattering beam Bc.