MULTILAYER ELECTRONIC COMPONENT

To prevent deterioration of dielectric properties of a multilayer electronic component even in a high-temperature/high-pressure environment and to improve reliability.SOLUTION: A multilayer electronic component includes: a body including a dielectric layer and internal electrodes; and external elect...

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Hauptverfasser: NAM CHAN HEE, PAEK KWAN YEOL, CHUNG HAE SUK, LEE CHANG GEON, PARK JAE-HYUN, GWON OH HUN
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To prevent deterioration of dielectric properties of a multilayer electronic component even in a high-temperature/high-pressure environment and to improve reliability.SOLUTION: A multilayer electronic component includes: a body including a dielectric layer and internal electrodes; and external electrodes disposed on the body. The dielectric layer includes a plurality of dielectric crystal grains having a perovskite-based composition represented by ABO3, the A includes a first element including at least one of Bi, Na, K, Sr, and Ca, and the B includes a second element including Ti. At least one of the plurality of dielectric crystal grains has a core-shell structure including a core portion on an internal side and a shell portion covering at least a portion of the core portion. A content of the first element included in the core portion is twice or more than a content of the first element included in the shell portion. The core portion includes a first core portion on an internal side and a second core portion which covers at least a portion of the first core portion, the second core portion including Zr.SELECTED DRAWING: Figure 8 【課題】高温/高圧の環境でも積層型電子部品の誘電特性が低下することを防止し、信頼性を向上させる。【解決手段】本発明の一実施形態による積層型電子部品は、誘電体層及び内部電極を含む本体と、上記本体上に配置される外部電極と、を含み、上記誘電体層は、ABO3で表されるペロブスカイト系組成を有する複数の誘電体結晶粒を含み、上記Aは、Bi、Na、K、Sr及びCaのうち少なくとも一つを含む第1元素を含み、上記Bは、Tiを含む第2元素を含み、上記複数の誘電体結晶粒のうち少なくとも一つは、内側のコア部と上記コア部の少なくとも一部をカバーするシェル部とを含むコア-シェル構造を有し、上記コア部に含まれた上記第1元素の含量は、上記シェル部に含まれた第1元素の含量の2倍以上であり、上記コア部は、内側の第1コア部と上記第1コア部の少なくとも一部をカバーする第2コア部とを含み、上記第2コア部はZrを含むことができる。【選択図】図8