PLASMA PROCESSING APPARATUS

To provide a plasma device which can perform stably reduction treatment being a simple dry process without requiring a gasification of a complex liquid raw material, or etching treatment, and does not has means of gasificating the liquid raw material.SOLUTION: A plasma device configured to perform r...

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Bibliographische Detailangaben
Hauptverfasser: NOBORIO KAZUYUKI, TAGUCHI KOJI, YAMAHARA MOTOHIRO
Format: Patent
Sprache:eng ; jpn
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Beschreibung
Zusammenfassung:To provide a plasma device which can perform stably reduction treatment being a simple dry process without requiring a gasification of a complex liquid raw material, or etching treatment, and does not has means of gasificating the liquid raw material.SOLUTION: A plasma device configured to perform reduction treatment or an etching treatment of a treatment object front surface by a plasma, has a structure that a liquid raw material of a reduction gas or an etching gas is arranged in a vacuum chamber. The liquid raw material of the reduction gas or the etching gas is gasified in the vacuum chamber. The reduction treatment or the etching treatment is executed on a front surface of a substrate by using the plasma of the liquid raw material of the reduction gas or the etching gas.SELECTED DRAWING: Figure 2 【課題】簡便なドライプロセスであり複雑な液体原料のガス化が不要で、且つ安定的に還元処理、又はエッチング処理をすることが可能であり、液体原料をガス化する手段を有しないプラズマ装置を提供する。【解決手段】プラズマによる処理対象物表面を還元処理、又はエッチング処理するプラズマ装置であって、真空チャンバー内に、前記還元ガス、又はエッチングガスの液体原料を配置する構造を有し、且つ、前記還元ガス、又はエッチングガスの液体原料を上記真空チャンバー内でガス化し、前記還元ガス、又はエッチングガスの液体原料のプラズマにより、基板表面上を還元処理、又はエッチング処理することを特徴とする。【選択図】図2