CHARGED PARTICLE ASSESSMENT TOOL AND INSPECTION METHOD

To provide a charged-particle assessment tool comprising: a condenser lens array; a collimator; a plurality of objective lenses; and an electric power source.SOLUTION: The condenser lens array is configured to divide a beam of charged particles into a plurality of sub-beams and to focus each of the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: MARCO JAN-JACO WIELAND
Format: Patent
Sprache:eng ; jpn
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!