POSITION SPECIFICATION DEVICE AND POSITION SPECIFICATION METHOD

To improve the accuracy of specifying the position of a positioning target.SOLUTION: A position specification device 1 includes: a first similarity degree calculation unit 21 which calculates a first degree of similarity for each of a plurality of measurement points P; a first difference calculation...

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Hauptverfasser: ATARASHI YUTARO, KAWABATA KAORU
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To improve the accuracy of specifying the position of a positioning target.SOLUTION: A position specification device 1 includes: a first similarity degree calculation unit 21 which calculates a first degree of similarity for each of a plurality of measurement points P; a first difference calculation unit 31 which previously calculates a first difference for each of the plurality of measurement points; a second difference calculation unit 32 which calculates a second difference for each of the plurality of measurement points P; a second similarity degree calculation unit 22 which calculates a second degree of similarity as a degree of similarity between the first difference and the second difference for each of the plurality of measurement points P; and a specification unit 40 which specifies the position of a positioning target based on the first degree of similarity and the second degree of similarity.SELECTED DRAWING: Figure 1 【課題】被測位対象の位置の特定精度を向上させる。【解決手段】位置特定装置1は、複数の測定点Pのそれぞれについて第1類似度を算出する第1類似度算出部21と、複数の測定点のそれぞれについて予め第1差分を算出する第1差分算出部31と、複数の測定点Pのそれぞれについて第2差分を算出する第2差分算出部32と、第1差分と第2差分との類似度である第2類似度を、複数の測定点Pのそれぞれについて算出する第2類似度算出部22と、第1類似度と第2類似度とに基づいて、被測位対象の位置を特定する特定部40と、を備える。【選択図】図1