SAMPLE CUTTING JIG, CUTTING TOOL SET, AND SAMPLE CUTTING METHOD

To provide a sample cutting jig, a cutting tool set, and a sample cutting method in which cut pieces of a sample can be accurately cut out inexpensively and easily.SOLUTION: A sample cutting jig 20 mounted on a sample S in cutting off the sample S by using a cutting blade 10 comprises a pair of slit...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: TAKASHIMA TORU
Format: Patent
Sprache:eng ; jpn
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:To provide a sample cutting jig, a cutting tool set, and a sample cutting method in which cut pieces of a sample can be accurately cut out inexpensively and easily.SOLUTION: A sample cutting jig 20 mounted on a sample S in cutting off the sample S by using a cutting blade 10 comprises a pair of slits for width 32 and a pair of slits for length 36. The pair of slits for width 32 extend in parallel with each other with a first distance, and are used in order to cut off the sample S by a width corresponding to the first distance by allowing the cutting blade 10 to insert and slide to cut off the sample S. The pair of slits for length 36 extend in parallel with each other with a second distance different from the first distance, and are used in order to cut off the sample by a length corresponding to the second distance by allowing the cutting blade 10 to insert and slide to cut off the sample S.SELECTED DRAWING: Figure 2 【課題】安価かつ簡単に、試料の切断片を精度良く切り出すことができる試料切断用治具、切断用具セット及び試料切断方法を提供する。【解決手段】切断刃10を用いて試料Sを切断する際に、試料S上に載置される試料切断用治具20であって、1対の幅用スリット32と、1対の長さ用スリット36とを備える。1対の幅用スリット32は、第1の間隔を隔てて互いに平行に延び、切断刃10を挿通しスライドさせて試料Sを切断することにより、第1の間隔に対応する幅で試料Sを切断するために用いられる。1対の長さ用スリット36は、第1の間隔とは異なる第2の間隔を隔てて互いに平行に延び、切断刃10を挿通しスライドさせて試料Sを切断することにより、第2の間隔に対応する長さで前記試料を切断するために用いられる。【選択図】 図2