SPECTROSCOPIC METHOD OF MEASURING INTERFACE REGIONS

To provide a spectroscopic method of measuring interface regions, which allows interface region information to be acquired using just a general-purpose spectrometer and enables material designing according to applications.SOLUTION: A spectroscopic method of measuring interface regions according to t...

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Bibliographische Detailangaben
Hauptverfasser:	HAYASHI TOMOHIRO, MATSUDA TOMOMASA, ISSHIKI AYAKO
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	To provide a spectroscopic method of measuring interface regions, which allows interface region information to be acquired using just a general-purpose spectrometer and enables material designing according to applications.SOLUTION: A spectroscopic method of measuring interface regions according to the present invention is for measuring an infrared spectrum of an interface region of a sample using a spectrometer with a prism. The spectroscopic method of measuring interface regions according to the present invention comprises a measurement step of measuring an infrared spectrum while adjusting the distance between the sample and the prism, and a computation step of resolving the infrared spectrum at each distance obtained in the measurement step using the multivariate curve resolution method to derive an infrared spectrum of the interface region.SELECTED DRAWING: None 【課題】本発明によれば、汎用分光装置のみで界面領域の情報が得られ、用途に応じた材料設計が可能となる分光法による界面領域の測定方法を提供することを目的とする。【解決手段】本発明の分光法による界面領域の測定方法は、プリズムを備える分光装置を用いて、試料の界面領域の赤外スペクトルを測定する方法である。本発明の分光法による界面領域の測定方法は、前記試料と前記プリズム間の距離を調整しながら赤外スペクトルを測定する測定工程と；前記測定工程で得られた、前記各距離の前記赤外スペクトルを多変量スペクトル分離法でスペクトル分離し、前記界面領域の赤外スペクトルを算出する算出工程と；を含む。【選択図】なし