INSPECTION DEVICE AND STAMP INSPECTION DEVICE USING THE SAME

To provide an inspection device capable of accurately inspecting whether or not a chip component is adhered to the predetermined place of a stamp, with a compact device configuration, even when the chip component is small and to provide a stamp inspection device using the inspection device.SOLUTION:...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SENDA MASAFUMI, KITAMURA MASARU
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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