FILM FORMATION DEVICE

To provide a film formation device capable of forming, on a substrate, an object film having more uniform film thickness.SOLUTION: This film formation device 100 comprises a chamber 1, a mounting stand 21, and a fluid head 3. The fluid head 3 is provided to a position, within the chamber 1, that fac...

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Hauptverfasser: MIYAGI MASAHIRO, INABA MAKI
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creator MIYAGI MASAHIRO
INABA MAKI
description To provide a film formation device capable of forming, on a substrate, an object film having more uniform film thickness.SOLUTION: This film formation device 100 comprises a chamber 1, a mounting stand 21, and a fluid head 3. The fluid head 3 is provided to a position, within the chamber 1, that faces a first main surface of a substrate W that is mounted on the mounting stand 21. The fluid head 3 has a plasma chamber 4b, a plasma source 5, a plurality of first outflow ports 4c, a gas flow path 6b, and a plurality of second outflow ports 6c. The plasma source 5 turns a first raw-material gas into plasma in the plasma chamber 4b. The first outflow ports 4c are arranged in a two-dimensional array in an overlapping region that overlaps the first main surface of the substrate W as seen in plan view. An active species that is derived from the first raw-material gas flows from the first outflow ports 4c toward the first main surface of the substrate W. The plurality of second outflow ports 6c are arranged in a two-dimensional array at different positions than the plurality of first outflow ports 4c in the overlapping region. A second raw-material gas flows from the plurality of second outflow ports 6c toward the first main surface of the substrate W.SELECTED DRAWING: Figure 1 【課題】より均一な膜厚で対象膜を基板に形成することができる成膜装置を提供する。【解決手段】成膜装置100はチャンバ1と載置台21と流体ヘッド3とを備える。流体ヘッド3は、チャンバ1内において、載置台21に載置された基板Wの第1主面と向かい合う位置に設けられている。流体ヘッド3はプラズマ室4bとプラズマ源5と複数の第1流出口4cとガス流路6bと複数の第2流出口6cとを有する。プラズマ源5はプラズマ室4bにおいて第1原料ガスをプラズマ化させる。第1流出口4cは、基板Wの第1主面と平面視で重なる重複領域において2次元的に分散配列される。第1原料ガス由来の活性種は第1流出口4cから基板Wの第1主面に向かって流出する。複数の第2流出口6cは当該重複領域において、複数の第1流出口4cとは異なる位置に2次元的に分散配列される。第2原料ガスは複数の第2流出口6cから基板Wの第1主面に向かって流出する。【選択図】図1
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The fluid head 3 is provided to a position, within the chamber 1, that faces a first main surface of a substrate W that is mounted on the mounting stand 21. The fluid head 3 has a plasma chamber 4b, a plasma source 5, a plurality of first outflow ports 4c, a gas flow path 6b, and a plurality of second outflow ports 6c. The plasma source 5 turns a first raw-material gas into plasma in the plasma chamber 4b. The first outflow ports 4c are arranged in a two-dimensional array in an overlapping region that overlaps the first main surface of the substrate W as seen in plan view. An active species that is derived from the first raw-material gas flows from the first outflow ports 4c toward the first main surface of the substrate W. The plurality of second outflow ports 6c are arranged in a two-dimensional array at different positions than the plurality of first outflow ports 4c in the overlapping region. A second raw-material gas flows from the plurality of second outflow ports 6c toward the first main surface of the substrate W.SELECTED DRAWING: Figure 1 【課題】より均一な膜厚で対象膜を基板に形成することができる成膜装置を提供する。【解決手段】成膜装置100はチャンバ1と載置台21と流体ヘッド3とを備える。流体ヘッド3は、チャンバ1内において、載置台21に載置された基板Wの第1主面と向かい合う位置に設けられている。流体ヘッド3はプラズマ室4bとプラズマ源5と複数の第1流出口4cとガス流路6bと複数の第2流出口6cとを有する。プラズマ源5はプラズマ室4bにおいて第1原料ガスをプラズマ化させる。第1流出口4cは、基板Wの第1主面と平面視で重なる重複領域において2次元的に分散配列される。第1原料ガス由来の活性種は第1流出口4cから基板Wの第1主面に向かって流出する。複数の第2流出口6cは当該重複領域において、複数の第1流出口4cとは異なる位置に2次元的に分散配列される。第2原料ガスは複数の第2流出口6cから基板Wの第1主面に向かって流出する。【選択図】図1</description><language>eng ; jpn</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; PLASMA TECHNIQUE ; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS ; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS ; SEMICONDUCTOR DEVICES ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240403&amp;DB=EPODOC&amp;CC=JP&amp;NR=2024046178A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240403&amp;DB=EPODOC&amp;CC=JP&amp;NR=2024046178A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MIYAGI MASAHIRO</creatorcontrib><creatorcontrib>INABA MAKI</creatorcontrib><title>FILM FORMATION DEVICE</title><description>To provide a film formation device capable of forming, on a substrate, an object film having more uniform film thickness.SOLUTION: This film formation device 100 comprises a chamber 1, a mounting stand 21, and a fluid head 3. The fluid head 3 is provided to a position, within the chamber 1, that faces a first main surface of a substrate W that is mounted on the mounting stand 21. The fluid head 3 has a plasma chamber 4b, a plasma source 5, a plurality of first outflow ports 4c, a gas flow path 6b, and a plurality of second outflow ports 6c. The plasma source 5 turns a first raw-material gas into plasma in the plasma chamber 4b. The first outflow ports 4c are arranged in a two-dimensional array in an overlapping region that overlaps the first main surface of the substrate W as seen in plan view. An active species that is derived from the first raw-material gas flows from the first outflow ports 4c toward the first main surface of the substrate W. The plurality of second outflow ports 6c are arranged in a two-dimensional array at different positions than the plurality of first outflow ports 4c in the overlapping region. A second raw-material gas flows from the plurality of second outflow ports 6c toward the first main surface of the substrate W.SELECTED DRAWING: Figure 1 【課題】より均一な膜厚で対象膜を基板に形成することができる成膜装置を提供する。【解決手段】成膜装置100はチャンバ1と載置台21と流体ヘッド3とを備える。流体ヘッド3は、チャンバ1内において、載置台21に載置された基板Wの第1主面と向かい合う位置に設けられている。流体ヘッド3はプラズマ室4bとプラズマ源5と複数の第1流出口4cとガス流路6bと複数の第2流出口6cとを有する。プラズマ源5はプラズマ室4bにおいて第1原料ガスをプラズマ化させる。第1流出口4cは、基板Wの第1主面と平面視で重なる重複領域において2次元的に分散配列される。第1原料ガス由来の活性種は第1流出口4cから基板Wの第1主面に向かって流出する。複数の第2流出口6cは当該重複領域において、複数の第1流出口4cとは異なる位置に2次元的に分散配列される。第2原料ガスは複数の第2流出口6cから基板Wの第1主面に向かって流出する。【選択図】図1</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>PLASMA TECHNIQUE</subject><subject>PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS</subject><subject>PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBB18_TxVXDzD_J1DPH091NwcQ3zdHblYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBkYmBiZmhuYWjsZEKQIAyZQfOw</recordid><startdate>20240403</startdate><enddate>20240403</enddate><creator>MIYAGI MASAHIRO</creator><creator>INABA MAKI</creator><scope>EVB</scope></search><sort><creationdate>20240403</creationdate><title>FILM FORMATION DEVICE</title><author>MIYAGI MASAHIRO ; INABA MAKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2024046178A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>PLASMA TECHNIQUE</topic><topic>PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS</topic><topic>PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>MIYAGI MASAHIRO</creatorcontrib><creatorcontrib>INABA MAKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MIYAGI MASAHIRO</au><au>INABA MAKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FILM FORMATION DEVICE</title><date>2024-04-03</date><risdate>2024</risdate><abstract>To provide a film formation device capable of forming, on a substrate, an object film having more uniform film thickness.SOLUTION: This film formation device 100 comprises a chamber 1, a mounting stand 21, and a fluid head 3. The fluid head 3 is provided to a position, within the chamber 1, that faces a first main surface of a substrate W that is mounted on the mounting stand 21. The fluid head 3 has a plasma chamber 4b, a plasma source 5, a plurality of first outflow ports 4c, a gas flow path 6b, and a plurality of second outflow ports 6c. The plasma source 5 turns a first raw-material gas into plasma in the plasma chamber 4b. The first outflow ports 4c are arranged in a two-dimensional array in an overlapping region that overlaps the first main surface of the substrate W as seen in plan view. An active species that is derived from the first raw-material gas flows from the first outflow ports 4c toward the first main surface of the substrate W. The plurality of second outflow ports 6c are arranged in a two-dimensional array at different positions than the plurality of first outflow ports 4c in the overlapping region. A second raw-material gas flows from the plurality of second outflow ports 6c toward the first main surface of the substrate W.SELECTED DRAWING: Figure 1 【課題】より均一な膜厚で対象膜を基板に形成することができる成膜装置を提供する。【解決手段】成膜装置100はチャンバ1と載置台21と流体ヘッド3とを備える。流体ヘッド3は、チャンバ1内において、載置台21に載置された基板Wの第1主面と向かい合う位置に設けられている。流体ヘッド3はプラズマ室4bとプラズマ源5と複数の第1流出口4cとガス流路6bと複数の第2流出口6cとを有する。プラズマ源5はプラズマ室4bにおいて第1原料ガスをプラズマ化させる。第1流出口4cは、基板Wの第1主面と平面視で重なる重複領域において2次元的に分散配列される。第1原料ガス由来の活性種は第1流出口4cから基板Wの第1主面に向かって流出する。複数の第2流出口6cは当該重複領域において、複数の第1流出口4cとは異なる位置に2次元的に分散配列される。第2原料ガスは複数の第2流出口6cから基板Wの第1主面に向かって流出する。【選択図】図1</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
PLASMA TECHNIQUE
PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS
PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS
SEMICONDUCTOR DEVICES
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title FILM FORMATION DEVICE
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