WORKPIECE INSPECTION METHOD AND INSPECTION DEVICE

To provide a workpiece inspection method and inspection device with which it is possible to determine a peeling layer formed in the inside of an ingot, without lowering productivity, and without being affected by saw marks.SOLUTION: The workpiece inspection method comprises: a peeling layer formatio...

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1. Verfasser: IGA YUTO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a workpiece inspection method and inspection device with which it is possible to determine a peeling layer formed in the inside of an ingot, without lowering productivity, and without being affected by saw marks.SOLUTION: The workpiece inspection method comprises: a peeling layer formation step for forming, in the inside of a workpiece 100, a peeling layer 110 that is composed of a modified layer parallel to a top face 101 and a crack extending from the modified layer; an irradiation step for irradiating the entire top face 101 of the workpiece 100 in which the peeling layer 110 has been formed, with light 25 of a wavelength that passes through the workpiece 100 and is reflected at a crack of the peeling layer 110, after the peeling layer formation step is carried out; a light reception step for receiving reflected light 35 having been irradiated and reflected by a crack in the irradiation step; and a determination step for determining the state of the peeling layer 110 on the basis of the intensity of reflected light 35 having been received in the light reception step.SELECTED DRAWING: Figure 6 【課題】インゴットの内部に形成された剥離層を、生産性を低下させることなく、なおかつ、ソーマークの影響を受けることなく判定することが可能な被加工物の検査方法及び検査装置を提供すること。【解決手段】被加工物の検査方法は、被加工物100の内部に上面101に平行な改質層及び改質層から伸展するクラックとからなる剥離層110を形成する剥離層形成ステップと、剥離層形成ステップを実施した後、被加工物100を透過するとともに剥離層110のクラックで反射する波長の光25を剥離層110が形成された被加工物100の上面101の全面に対して照射する照射ステップと、照射ステップで照射され、クラックにより反射された反射光35を受光する受光ステップと、受光ステップで受光した反射光35の強度に基づいて、剥離層110の状態を判定する判定ステップと、を備える。【選択図】図6