LASER SCANNING CONTROL DEVICE, LASER SCANNING DEVICE, LASER SCANNING CONTROL METHOD, AND PROGRAM

To provide a technique for solving problems related to intense light reflected from a reflector target in laser scanning.SOLUTION: A processing device 500 controls laser scanning performed by a laser scanning device 200 including a light receiving section 202. The processing device comprises: a lase...

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1. Verfasser: SUGIMOTO HIROAKI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a technique for solving problems related to intense light reflected from a reflector target in laser scanning.SOLUTION: A processing device 500 controls laser scanning performed by a laser scanning device 200 including a light receiving section 202. The processing device comprises: a laser scanning control section 501 that causes the laser scanning device to execute first laser scanning (normal scanning) performed under conditions in which distance measurement accuracy is reduced in the light receiving section 202 by light reflected from reflection prisms and second laser scanning (adjusted-light scanning) performed under conditions in which distance measurement accuracy is not reduced in the light receiving section 202 by light reflected from reflection prisms 300 and 400; a saturation determination section 502 that determines a state of saturation of the light receiving section 202, with respect to laser-scanned point groups obtained in the first laser scanning; and a variable attenuator control section 504 that adjusts the intensity of light to be received by the light receiving section 202 in the second laser scanning on the basis of determination in the saturation determination section 502.SELECTED DRAWING: Figure 3 【課題】レーザースキャンにおける反射体ターゲットからの強い反射光に係る問題を解決する技術を提供する。【解決手段】受光部202を備えたレーザースキャン装置200によるレーザースキャンを制御する処理装置500であって、反射プリズムからの反射光により受光部202での測距精度の低下が生じる条件で行う第1のレーザースキャン(通常スキャン)と、反射プリズム300,400からの反射光による受光部202での測距精度の低下が生じない条件で行う第2のレーザースキャン(調光スキャン)を実行させるレーザースキャン制御部501と、前記第1のレーザースキャンにおいて得られたレーザースキャン点群の受光部202における飽和の状態を判定する飽和判定部502と、飽和判定部502における判定に基づき、前記第2のレーザースキャンにおける受光部202で受光する光の強度を調整する可変アッテネータの制御部504を備える。【選択図】図3