SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD
To provide a spectroscopic analysis system, etc. that makes it possible to appropriately conduct measurement even when measurement time, etc is limited.SOLUTION: A spectroscopic analysis system 100 comprises: an operation panel 21 that accepts the upper-limit value of measurement time of a spectrosc...
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| Sprache: | eng ; jpn |
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| Zusammenfassung: | To provide a spectroscopic analysis system, etc. that makes it possible to appropriately conduct measurement even when measurement time, etc is limited.SOLUTION: A spectroscopic analysis system 100 comprises: an operation panel 21 that accepts the upper-limit value of measurement time of a spectroscopic spectrum and/or the lower-limit value of measurement accuracy as a user set condition regarding the spectroscopic spectrum measurement of a sample; and a control unit 32 that derives a prescribed recommended measurement condition that would satisfy the user set condition and causes a display unit 22 to show the recommended measurement condition. The recommended measurement condition is at least one of the wavelength range of light that is used for measuring spectroscopic spectra, the wavelength sampling interval of light, the slit width of diffraction gratings 2a, 8a of a spectroscope that spectrally separates light, and the wavelength sweep speed of light.SELECTED DRAWING: Figure 1
【課題】測定時間等に制約がある場合でも適切に測定を行えるようにする分光分析システム等を提供する。【解決手段】分光分析システム１００は、試料の分光分析スペクトルの測定に関するユーザ設定条件として、分光分析スペクトルの測定時間の上限値、及び測定精度の下限値のうちの少なくとも一方の入力を受け付ける操作パネル２１と、ユーザ設定条件を満たすような所定の推奨測定条件を導き、推奨測定条件を表示部２２に表示させる制御部３２と、を備え、推奨測定条件は、分光分析スペクトルの測定に用いられる光の波長範囲、光の波長のサンプリング間隔、光を分光する分光器の回折格子２ａ，８ａのスリット幅、及び、光の波長の掃引速度のうちの少なくとも一つである。【選択図】図１ |
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