SUBSTRATE FOR INSPECTION DEVICE, INSPECTION DEVICE, AND METHOD FOR MANUFACTURING INSPECTION DEVICE

To provide a substrate for an inspection device capable of achieving both flow path forming property and flow property of a high-viscosity inspection object or a suspended inspection object, the inspection device using the substrate for the inspection device, and a method for manufacturing method of...

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Bibliographische Detailangaben
Hauptverfasser:	HIRAKAWA MANABU, MONJU TAKUYA
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	To provide a substrate for an inspection device capable of achieving both flow path forming property and flow property of a high-viscosity inspection object or a suspended inspection object, the inspection device using the substrate for the inspection device, and a method for manufacturing method of the inspection device.SOLUTION: A substrate for an inspection device has an average thickness of 250 μm or more and 350 μm or less, and density of 0.25×106 g/m3 or more and 0.40×106 g/m3 or less.SELECTED DRAWING: None 【課題】流路形成性と、高粘度な検査対象物又は懸濁した検査対象物の流通性とを両立できる検査デバイス用基材、前記検査デバイス用基材を用いた検査デバイス、及び検査デバイスの製造方法の提供。【解決手段】平均厚みが２５０μｍ以上３５０μｍ以下であり、かつ密度が０．２５×１０６ｇ／ｍ３以上０．４０×１０６ｇ／ｍ３以下である検査デバイス用基材である。【選択図】なし