SEMICONDUCTOR STORAGE DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR STORAGE DEVICE

To provide a semiconductor storage device having high performance.SOLUTION: A semiconductor storage device 10 includes a tunnel insulation film 53, a charge capture film 54 deposed on the tunnel insulation film 53, and a conductor layer 40 deposed on the charge capture film 54 through block insulati...

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Bibliographische Detailangaben
Hauptverfasser: ARIGA TOMOTAKA, KITAYAMA DAIKI, IKENO DAISUKE, KAJITA AKIHIRO, IKEDA MITSUO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a semiconductor storage device having high performance.SOLUTION: A semiconductor storage device 10 includes a tunnel insulation film 53, a charge capture film 54 deposed on the tunnel insulation film 53, and a conductor layer 40 deposed on the charge capture film 54 through block insulation films 55, 56. The conductor layer 40 includes a first layer 41 containing molybdenum, and a second layer 42 being a layer deposed at a position opposite from the block insulation films 55, 56 across the first layer 41 and containing tungsten.SELECTED DRAWING: Figure 13 【課題】性能の高い半導体記憶装置を提供する。【解決手段】半導体記憶装置10は、トンネル絶縁膜53と、トンネル絶縁膜53の上に設けられた電荷捕獲膜54と、電荷捕獲膜54の上にブロック絶縁膜55,56を介して設けられた導電体層40と、を備える。導電体層40は、モリブデンを含む第1層41と、第1層41を挟んでブロック絶縁膜55,56とは反対側となる位置に設けられた層であって、タングステンを含む第2層42と、を含む。【選択図】図13