ELECTRICAL CONDUCTIVE PARTICLE EVALUATION DEVICE AND ELECTRICAL CONDUCTIVE PARTICLE EVALUATION METHOD

To provide an electrical conductive particle evaluation device capable of a surface condition of an electrical conductive particle covered with fine particles in an easy measurement.SOLUTION: An electrical conductive particle evaluation device 1 evaluating a surface condition of an electrical conduc...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MATSUZAWA MITSUHARU, TOMISAKA KATSUHIKO, SEKI HIDEYUKI, YAMAZAKI SHOHEI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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