MICROSCOPE SYSTEM, PROJECTION UNIT, AND METHOD FOR PROJECTING IMAGE
To deal with a displacement of the focus of an imaging device of an AR microscope.SOLUTION: A microscope system 1 includes: an observation optical system 110 for forming an optical image of a sample S closer to an object than to an eyepiece 113; a projection device 301 as an overlapping device for o...
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| creator | TOMIOKA MASAHARU KONO TAKAYUKI KUSAKA KENICHI SAKURAI AYUMI |
| description | To deal with a displacement of the focus of an imaging device of an AR microscope.SOLUTION: A microscope system 1 includes: an observation optical system 110 for forming an optical image of a sample S closer to an object than to an eyepiece 113; a projection device 301 as an overlapping device for overlapping auxiliary information on an image surface P on which the optical image is formed; an imaging device 400 provided on an optical path which branches from an optical path of the observation optical system 110; and a controller 500 for controlling the projection device 301. The controller 500 switches the auxiliary information which the projection device 301 overlaps on the image surface P, between a taken image and analysis information on the result of image analysis of the taken image, according to the state of the microscope system 1.SELECTED DRAWING: Figure 1
【課題】ＡＲ顕微鏡における撮像装置のフォーカスずれに対処する。【解決手段】顕微鏡システム１は、接眼レンズ１１３よりも物体側に標本Ｓの光学像を形成する観察光学系１１０と、光学像が形成される像面Ｐに補助情報を重畳する重畳装置である投影装置３０１と、観察光学系１１０の光路から分岐した光路上に設けられた撮像装置４００と、投影装置３０１を制御する制御装置５００を備える。制御装置５００は、顕微鏡システム１の状態に応じて、投影装置３０１に像面Ｐ上に重畳させる補助情報を、撮像画像と撮像画像に対する画像解析の結果に関する解析情報との間で切り替える。【選択図】図１ |
| format | Patent |
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【課題】ＡＲ顕微鏡における撮像装置のフォーカスずれに対処する。【解決手段】顕微鏡システム１は、接眼レンズ１１３よりも物体側に標本Ｓの光学像を形成する観察光学系１１０と、光学像が形成される像面Ｐに補助情報を重畳する重畳装置である投影装置３０１と、観察光学系１１０の光路から分岐した光路上に設けられた撮像装置４００と、投影装置３０１を制御する制御装置５００を備える。制御装置５００は、顕微鏡システム１の状態に応じて、投影装置３０１に像面Ｐ上に重畳させる補助情報を、撮像画像と撮像画像に対する画像解析の結果に関する解析情報との間で切り替える。【選択図】図１</description><language>eng ; jpn</language><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231110&DB=EPODOC&CC=JP&NR=2023163524A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231110&DB=EPODOC&CC=JP&NR=2023163524A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TOMIOKA MASAHARU</creatorcontrib><creatorcontrib>KONO TAKAYUKI</creatorcontrib><creatorcontrib>KUSAKA KENICHI</creatorcontrib><creatorcontrib>SAKURAI AYUMI</creatorcontrib><title>MICROSCOPE SYSTEM, PROJECTION UNIT, AND METHOD FOR PROJECTING IMAGE</title><description>To deal with a displacement of the focus of an imaging device of an AR microscope.SOLUTION: A microscope system 1 includes: an observation optical system 110 for forming an optical image of a sample S closer to an object than to an eyepiece 113; a projection device 301 as an overlapping device for overlapping auxiliary information on an image surface P on which the optical image is formed; an imaging device 400 provided on an optical path which branches from an optical path of the observation optical system 110; and a controller 500 for controlling the projection device 301. The controller 500 switches the auxiliary information which the projection device 301 overlaps on the image surface P, between a taken image and analysis information on the result of image analysis of the taken image, according to the state of the microscope system 1.SELECTED DRAWING: Figure 1
【課題】ＡＲ顕微鏡における撮像装置のフォーカスずれに対処する。【解決手段】顕微鏡システム１は、接眼レンズ１１３よりも物体側に標本Ｓの光学像を形成する観察光学系１１０と、光学像が形成される像面Ｐに補助情報を重畳する重畳装置である投影装置３０１と、観察光学系１１０の光路から分岐した光路上に設けられた撮像装置４００と、投影装置３０１を制御する制御装置５００を備える。制御装置５００は、顕微鏡システム１の状態に応じて、投影装置３０１に像面Ｐ上に重畳させる補助情報を、撮像画像と撮像画像に対する画像解析の結果に関する解析情報との間で切り替える。【選択図】図１</description><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD29XQO8g929g9wVQiODA5x9dVRCAjy93J1DvH091MI9fMM0VFw9HNR8HUN8fB3UXDzD4LL-7krePo6urvyMLCmJeYUp_JCaW4GJTfXEGcP3dSC_PjU4oLE5NS81JJ4rwAjAyNjQzNjUyMTR2OiFAEAg2Ur1w</recordid><startdate>20231110</startdate><enddate>20231110</enddate><creator>TOMIOKA MASAHARU</creator><creator>KONO TAKAYUKI</creator><creator>KUSAKA KENICHI</creator><creator>SAKURAI AYUMI</creator><scope>EVB</scope></search><sort><creationdate>20231110</creationdate><title>MICROSCOPE SYSTEM, PROJECTION UNIT, AND METHOD FOR PROJECTING IMAGE</title><author>TOMIOKA MASAHARU ; KONO TAKAYUKI ; KUSAKA KENICHI ; SAKURAI AYUMI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2023163524A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2023</creationdate><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>TOMIOKA MASAHARU</creatorcontrib><creatorcontrib>KONO TAKAYUKI</creatorcontrib><creatorcontrib>KUSAKA KENICHI</creatorcontrib><creatorcontrib>SAKURAI AYUMI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TOMIOKA MASAHARU</au><au>KONO TAKAYUKI</au><au>KUSAKA KENICHI</au><au>SAKURAI AYUMI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MICROSCOPE SYSTEM, PROJECTION UNIT, AND METHOD FOR PROJECTING IMAGE</title><date>2023-11-10</date><risdate>2023</risdate><abstract>To deal with a displacement of the focus of an imaging device of an AR microscope.SOLUTION: A microscope system 1 includes: an observation optical system 110 for forming an optical image of a sample S closer to an object than to an eyepiece 113; a projection device 301 as an overlapping device for overlapping auxiliary information on an image surface P on which the optical image is formed; an imaging device 400 provided on an optical path which branches from an optical path of the observation optical system 110; and a controller 500 for controlling the projection device 301. The controller 500 switches the auxiliary information which the projection device 301 overlaps on the image surface P, between a taken image and analysis information on the result of image analysis of the taken image, according to the state of the microscope system 1.SELECTED DRAWING: Figure 1
【課題】ＡＲ顕微鏡における撮像装置のフォーカスずれに対処する。【解決手段】顕微鏡システム１は、接眼レンズ１１３よりも物体側に標本Ｓの光学像を形成する観察光学系１１０と、光学像が形成される像面Ｐに補助情報を重畳する重畳装置である投影装置３０１と、観察光学系１１０の光路から分岐した光路上に設けられた撮像装置４００と、投影装置３０１を制御する制御装置５００を備える。制御装置５００は、顕微鏡システム１の状態に応じて、投影装置３０１に像面Ｐ上に重畳させる補助情報を、撮像画像と撮像画像に対する画像解析の結果に関する解析情報との間で切り替える。【選択図】図１</abstract><oa>free_for_read</oa></addata></record> |
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| title | MICROSCOPE SYSTEM, PROJECTION UNIT, AND METHOD FOR PROJECTING IMAGE |
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