MICROSCOPE SYSTEM, PROJECTION UNIT, AND METHOD FOR PROJECTING IMAGE

To deal with a displacement of the focus of an imaging device of an AR microscope.SOLUTION: A microscope system 1 includes: an observation optical system 110 for forming an optical image of a sample S closer to an object than to an eyepiece 113; a projection device 301 as an overlapping device for o...

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Bibliographische Detailangaben
Hauptverfasser: TOMIOKA MASAHARU, KONO TAKAYUKI, KUSAKA KENICHI, SAKURAI AYUMI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To deal with a displacement of the focus of an imaging device of an AR microscope.SOLUTION: A microscope system 1 includes: an observation optical system 110 for forming an optical image of a sample S closer to an object than to an eyepiece 113; a projection device 301 as an overlapping device for overlapping auxiliary information on an image surface P on which the optical image is formed; an imaging device 400 provided on an optical path which branches from an optical path of the observation optical system 110; and a controller 500 for controlling the projection device 301. The controller 500 switches the auxiliary information which the projection device 301 overlaps on the image surface P, between a taken image and analysis information on the result of image analysis of the taken image, according to the state of the microscope system 1.SELECTED DRAWING: Figure 1 【課題】AR顕微鏡における撮像装置のフォーカスずれに対処する。【解決手段】顕微鏡システム1は、接眼レンズ113よりも物体側に標本Sの光学像を形成する観察光学系110と、光学像が形成される像面Pに補助情報を重畳する重畳装置である投影装置301と、観察光学系110の光路から分岐した光路上に設けられた撮像装置400と、投影装置301を制御する制御装置500を備える。制御装置500は、顕微鏡システム1の状態に応じて、投影装置301に像面P上に重畳させる補助情報を、撮像画像と撮像画像に対する画像解析の結果に関する解析情報との間で切り替える。【選択図】図1