SEALING RESIN COMPOSITION, SHEET MATERIAL, SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

To provide a sealing resin composition less likely to create cavities in a sealing material when manufacturing the sealing material for sealing the gap between the base material and the semiconductor chip by using a sheet material manufactured from the sealing resin composition.SOLUTION: A sealing r...

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Bibliographische Detailangaben
Hauptverfasser: AKASHI TAKAHIRO, MIZUTANI JUN, TANAKA KAZUNARI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a sealing resin composition less likely to create cavities in a sealing material when manufacturing the sealing material for sealing the gap between the base material and the semiconductor chip by using a sheet material manufactured from the sealing resin composition.SOLUTION: A sealing resin composition contains: a polyphenylene ether resin (A) that has a substituent that has radical polymerizability; tiallylisocyanurate (B); an inorganic filler (C); a radical polymerization initiator (D); and a thermoplastic elastomer (E). The percentage of the triallyl isocyanurate (B) is 5% by mass or more and 20% by mass or less based on the solid content of the sealing resin composition. The percentage of the thermoplastic elastomer (E) is 5% by mass or more and 18% by mass or less based on the solid content of the sealing resin composition.SELECTED DRAWING: Figure 1 【課題】封止用樹脂組成物から作製されたシート材を用いて基材と半導体チップとの隙間を封止する封止材を作製する場合に、封止材中に空洞を生じさせにくい封止用樹脂組成物を提供する。【解決手段】封止用樹脂組成物は、ラジカル重合性を有する置換基を有するポリフェニレンエーテル樹脂(A)と、トリアリルイソシアヌレート(B)と、無機充填材(C)と、ラジカル重合開始剤(D)と、熱可塑性エラストマー(E)とを含有する。トリアリルイソシアヌレート(B)の百分比は、封止用樹脂組成物の固形分量に対して5質量%以上20質量%以下である。熱可塑性エラストマー(E)の百分比は、封止用樹脂組成物の固形分量に対して5質量%以上18質量%以下である。【選択図】図1