POLARIZING MICROSCOPE DEVICE AND IN-VISUAL FIELD CORRECTION ANALYSIS METHOD

To provide a polarizing microscope device and an in-visual field correction analysis method which can highly accurately measure a magnetization characteristic in a visual field.SOLUTION: A polarizing microscope device 1 according to an embodiment comprises: a light source 10 which generates illumination light 21; a polarizer 12 on which the illumination light 21 is incident and which transmits the illumination light 21 including linear polarization in a first polarization direction; an objective lens 14 which illuminates a sample 20 with the illumination light 21 including the linear polarization and transmits reflection light 22 obtained with reflection of the illumination light 21 on the sample 20; an analyzer 17 which transmits a component of the linear polarization in the second polarization direction in the reflection light 22; an image acquisition unit 19 which acquires an image of the reflection light 22; a magnet 16 which generates an external magnetic field to be applied to the sample 20; and an image processing unit 30 which processes the acquired image. The image processing unit 30 calculates a device constant number including a polarization rotation angle distribution for each ROI in a visual field and a square distribution of an ellipticity, and calculates a rotation angle of Kerr rotation for each ROI from analysis using the device constant number and a hysteresis loop.SELECTED DRAWING: Figure 6 【課題】視野内の磁化特性を高精度に測定することができる偏光顕微鏡装置及び視野内補正解析方法を提供する。【解決手段】実施形態に係る偏光顕微鏡装置１は、照明光２１を生成する光源１０と、照明光２１が入射され、第１の偏光方向の直線偏光を含む照明光２１を透過させる偏光子１２と、直線偏光を含む照明光２１で試料２０を照明するとともに、照明光２１が試料２０で反射した反射光２２を透過させる対物レンズ１４と、反射光２２における第２の偏光方向の直線偏光の成分を透過させる検光子１７と、反射光２２の画像を取得する画像取得部１９と、試料２０に印加する外部磁場を生成する磁石１６と、取得した画像を処理する画像処理部３０と、を備え、画像処理部３０は、視野内のＲＯＩ毎の偏光回転角度分布、及び、楕円率の２乗分布を含む装置定数を算出し、装置定数及びヒステリシスループを用いた解析からＲＯＩ毎にカー回転の回転角を算出する。【選択図】図６