SEMICONDUCTOR FIELD-EFFECT TRANSISTOR, POWER AMPLIFIER INCLUDING THE SAME, AND METHOD OF MANUFACTURING THE SAME
To not only control a threshold voltage through the adjustment of the charge, but also maintain original advantages of various semiconductor field effect transistors through further reduction in the contact resistance and series resistance, as well as, with superior linearity being exhibited, furthe...
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Sprache: | eng ; jpn |
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Zusammenfassung: | To not only control a threshold voltage through the adjustment of the charge, but also maintain original advantages of various semiconductor field effect transistors through further reduction in the contact resistance and series resistance, as well as, with superior linearity being exhibited, further enhance latent value of the present invention applied to related fields of high-frequency power amplifiers.SOLUTION: There are provided a semiconductor device 200A which includes a GaN-based compound semiconductor field effect transistor, a power amplifier including the same, and a method of manufacturing the same, wherein: the transistor includes a substrate 210, a buffer layer 220, a channel block 230, a source electrode 240, a gate electrode 250, and a drain electrode 260; an n type doped layer 234 is provided at a position close to a border of a two-dimensional electron gas region 232G in the channel block 230; and the n type doped layer 234 varies a spatial distribution of electron density in the transistor to improve RF linearity of the whole component.SELECTED DRAWING: Figure 4
【課題】電荷を調整することによって閾値電圧を制御できるだけでなく、接触抵抗や直列抵抗をさらに低減することにより、様々な半導体電界効果トランジスタの本来の利点を保持するだけでなく、優れた線形性を有し、高周波電力増幅器の関連分野に適用される本発明の潜在的価値をさらに高める。【解決手段】GaNベースの化合物半導体電界効果トランジスタを含む半導体装置200A、それを含む電力増幅器およびその製造方法であって、トランジスタは、基板210、バッファ層220、チャネルブロック230、ソース電極240、ゲート電極250およびドレイン電極260を含み、チャネルブロック230内の二次元電子ガス領域232Gの境界寄りの位置にn型ドープ層234が設けられ、n型ドープ層234がトランジスタ内の電子濃度の空間分布を変更し、コンポーネント全体のRF線形性を改善する。【選択図】図4 |
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