PLATING APPARATUS

To provide a plating apparatus that can improve the uniformity of a plating film formed on a substrate.SOLUTION: A plating apparatus comprises: a plating tank; a substrate holder for holding a substrate; and an anode arranged in the plating tank so as to face the substrate held by the substrate hold...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ISHII TSUBASA, OBUCHI SHINJI, SHIMOYAMA TADASHI, MASUTANI KOICHI
Format: Patent
Sprache:eng ; jpn
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Beschreibung
Zusammenfassung:To provide a plating apparatus that can improve the uniformity of a plating film formed on a substrate.SOLUTION: A plating apparatus comprises: a plating tank; a substrate holder for holding a substrate; and an anode arranged in the plating tank so as to face the substrate held by the substrate holder. The plating apparatus also comprises: a conduit tube, at least part of which is filled with a plating solution, having a first part including an open end arranged in an area between the substrate held by the substrate holder and the anode, and a second part separated from the area between the substrate held by the substrate holder and the anode; and a potential sensor which is arranged on the second part of the conduit tube and configured so as to measure a potential of the plating solution.SELECTED DRAWING: Figure 4 【課題】基板に形成されるめっき膜の均一性の向上を図ることができるめっき装置を提案する。【解決手段】めっき装置は、めっき槽と、基板を保持するための基板ホルダと、前記基板ホルダに保持された基板と対向するように前記めっき槽内に配置されたアノードと、を備える。また、めっき装置は、前記基板ホルダに保持された基板と前記アノードとの間の領域に配置された開口端を含む第1部分、および、前記基板ホルダに保持された基板と前記アノードとの間の領域から離れた第2部分を有し、めっき液で少なくとも一部が満たされる導管と、前記導管の前記第2部分に配置され、めっき液の電位を計測するように構成された電位センサと、を備える。【選択図】図4